Resources

Stay up to date with the latest from LayTec! In this section, you’ll find the most recent news and announcements, details on upcoming industry events where you can meet us, and a library of downloadable materials including product datasheets, brochures, and technical documents.

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News

Events

Downloads

Name Size
Talk - Precise determination of layer thickness and monitoring of surface roughness by in-situ metrology during MOVPE of deep UV LED structures 2.13 MB
Enhancements in endpoint detection: Interview Oxford Instruments & LayTec 592.84 KB
EpiX® product configuration overview 2.74 MB
Office license and central database white paper 621.51 KB
Press release University of Stuttgart - Perovskite research meets advanced metrology 126.3 KB
Talk - SPIE 2026 Advances and new trends in in-situ and connected metrology 3.38 MB
SimulyzR and EtchNet for etch process control application note 924.9 KB
TRIton for GaAs application note 1.52 MB
Press release Korea Kiyon: Driving perovskite manufacturing with real-time in-situ PL 350.88 KB
PVScanner flyer 223.03 KB
AbsoluT reference temperature application note 469.37 KB
Connected Metrology® white paper 1.83 MB
EpiX C2C for GaN power white paper 2.41 MB
Press release - Sandia National Laboratories selects LayTec’s EpiX® for advanced optical wafer characterization 319.81 KB
TRIton for GaN application note 1.84 MB
Brunner_FBH: In-situ metrology during homoepitaxial growth of GaN 1.82 MB
Haberland_LayTec: Latest developments at LayTec 2.72 MB
Takeuchi_Meijo_University: In-situ measurements and control towards high-efficiency GaN-based VCSELs 1.99 MB
Press release: LayTec’s customized EpiTT 4W with 280 nm reflectometry installed at IKZ to advance gallium oxide research 437.34 KB
Talk: In-situ Characterization of 2D-Materials MOCVD growth 1 MB

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