In many cases, highly specialized devices depend on unique parameters that require dedicated metrology approaches to effectively monitor and control these parameters during processing. Some prominent examples are discussed in this section.

LayTec offers metrology solutions particularly designed for critical processes in the production processes of photovoltaic (PV) modules. For crystalline photovoltaics, we focus on the quality control of the module encapsulation processes whereas for thin film PV, practically all frontend deposition processes can be controlled by applying either in-situ or in-line optical metrology methods. The latter can also be applied in the currently emerging field of tandem PV devices composed of either two thin film devices (e.g. CIGS and perovskites) or on a combination of silicon and perovskite solar cells.

Within the field of compound semiconductors several groups of materials represent different fields of applications due to the particular properties of the compounds of each group, which are defined by the atoms forming these compounds. Most prominently, arsenides, nitrides and phosphides need to be mentioned, whereas further applications rely on antimonides, tellurides or certain oxides.