Resources

Stay up to date with the latest from LayTec! In this section, you’ll find the most recent news and announcements, details on upcoming industry events where you can meet us, and a library of downloadable materials including product datasheets, brochures, and technical documents.

News Events Downloads

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News

Events

Downloads

Name Size
Talk - Connected metrology characterizing complex layer stacks 4.36 MB
Talk - UV-vis reflectance mapping of nitride-based device structures 4.12 MB
X Link offline flyer 2.08 MB
X Link offline manual data sheet 1.69 MB
EpiNet algorithm-deep-dive vol 1 flyer 166.88 KB
EpiNet algorithm-deep-dive vol 2 flyer 202.44 KB
EpiNet algorithm-deep-dive vol 3 flyer 432.15 KB
EpiNet algorithm-deep-dive vol 4 flyer 380.83 KB
EpiNet algorithm-deep-dive vol 5 flyer 330.41 KB
EpiX GaN-power flyer 1.62 MB
EpiX VCSEL flyer 1.58 MB
TRIton for InP application note 1.39 MB
ALignR application note 433.08 KB
Talk - Connected metrology at mp future days 4.36 MB
Talk - ICP-etching of GaN HFET structures at apcm 2024 1.6 MB
Talk - Metrology ultra-high-yield diode lasers at IPC 2024 2.29 MB
Talk - Perovskite thin-film formation 6.05 MB
Talk - Plasma etching of InP-based lasers at APCM_2025 2.51 MB
Talk - UV-vis reflectance mapping of nitride based device structures 4.12 MB
Talk - Precise determination of layer thickness and monitoring of surface roughness by in-situ metrology during MOVPE of deep UV LED structures 2.13 MB

Contact

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