Resources

Stay up to date with the latest from LayTec! In this section, you’ll find the most recent news and announcements, details on upcoming industry events where you can meet us, and a library of downloadable materials including product datasheets, brochures, and technical documents.

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Downloads

Name Size
Singfilm choses LayTec's flames for in-line monitoring of perovskite film thickness - application note 1.39 MB
ILMetro data sheet 1.01 MB
ILMetro R2R application note 849 KB
ILMetro R2R data sheet 920.69 KB
In-line monitoring of layer properties and thickness application note 526.33 KB
In-line testing of EVA cross-linking degree application note 665.39 KB
In-line thickness monitoring R2R OLED and OPV application note 1.09 MB
In-situ characterization of 2D materials growth 2.48 MB
IQE_Ben Stevens: EpiTT in mass production environment 1.19 MB
LayTec_Christian Kaspari: Connected metrology from epi to etch 1.34 MB
LayTec's EpiNet webinar 2026 2.21 MB
NEPtune data sheet 650.38 KB
Newsletter April 2020 - AlInN composition control for III-Nitride VCSELs 524.93 KB
Newsletter December 2018 - GaAs based edge-emitting high-power IR lasers 282.5 KB
Newsletter January 2020 - MBE_Facet & InP-QCLs 465.08 KB
Newsletter July 2021 - In-situ monitoring of perovskite formation & in-line thickness monitoring 720.82 KB
Newsletter July 2022 - In-situ monitoring of 2D materials 404.86 KB
Newsletter March 2020 - InspiRe in-situ monitoring perovskites 803.71 KB
Newsletter March 2021 - Photoluminescence characterization of compound semiconductor thin films 720.82 KB
Newsletter May 2020 - EpiTT FaceT & EpiTT Band Edge MBE 398.65 KB

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