Perovskite, organic PV and hybrid materials
In-situ and in-line metrology for film formation process control of perovskites and other emerging materials.
In the last years perovskite solar cells as well as perovskite-based tandem devices have gone through an unprecedented increase of solar power conversion efficiency. Nowadays, Si-perovskite tandem cells exhibit by far the highest efficiency of all mass-production-compatible PV technologies. However, this technology is currently still in its pre-industrial stage even though first pilot and small-scale production lines are coming on-line. In order to become the dominating PV technology, various hurdles still need to be overcome: Efficiency levels need to be transferred from small to large areas, device stability must be improved and also the usage of toxic materials should be addressed. Hence, whilst the industrial scale-up is already initiated, still a lot of research effort needs to be taken.
LayTec offers metrology solution which are meant to accelerate both areas: Whilst in-situ methods can be used to obtain an improved understanding of the layer formation and degradation mechanisms in academic research, in-line metrology can support the scale-up by assessing the large area homogeneity of the layers as well as production yield.
Due to similar deposition procedures, the same solution offered for perovskites can also be applied to organic PV materials and for those of hybrid materials.
Automated 24/7 in-line monitoring
MES communication of measurement results
In-situ determination of liquid and/or solid film thickness and bandgap
In-situ visualization of growth and formation kinetics
Spatially resolved in-line information about band gap, material composition and quality of the thin film material
Fast identification of faulty substrates before the cost-intensive back-end processing
Fast in-line measurement time of only 0.1 s; in-situ even shorter times can be realized
In-line measurement of the sheet resistance of conducting layers
Applicable to rigid (sheet-to-sheet) and flexible (roll-to-roll) configuration
Direct measurement of the charge carrier lifetime by time-resolved photoluminescence
Simultaneous in-situ measurement of the film thickness, bandgap and roughness
Metrology solutions
Reflectance based metrology solution
LayTec offers a wide range of metrology systems for process monitoring of perovskite and related materials formation processes. Whilst LayTec’s InspiRe metrology system can be used for monitoring the film formation kinetics during spin-coating, slot-die-coating, physical vapor deposition (PVD) and the subsequent annealing processes by means of spectral reflectance measurements, the Flames and ILMetro systems can be applied for in-line monitoring of practically all layers during industrial production. Here, properties such as film thickness, bandgap, surface roughness, sheet resistance and charge carrier lifetime can be measured in rapid tact times as low as 0.1 sec.
Photoluminesence
One particular advantage of perovskite processes lies in the low process temperatures, which allow for applying PL methods not only in-line but even in-situ. This allows unprecedented insights into the thin film formation processes, which are not available for high-temperature processes like CIGs or III-V epitaxy.
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