Crystalline silicon PV modules (c-Si)

Quality control of PV module encapsulants and polymer foils.

Applications Metrology solutions Related products

c-Si-based PV modules comprise on silicon solar cells which are connected by metallic interconnectors and embedded in a glass/polymer encapsulation in order to protect them from environmental influences and prevent module and thereby power degradation. Recently, research also focuses on combining such c-Si solar cells with additional thin film solar cells in so-called tandem devices which can then be handled like conventional c-Si devices but can yield much higher power than those. Whilst LayTec’s thin film metrology systems can be applied for tandem devices, the quality of the encapsulation of conventional c-Si PV modules can be assessed by LayTec’s X Link® metrology system..

  • Rapid non-destructive encapsulation quality control in <1min

  • Applicable directly on production modules for glass/backsheet modules

  • Applicable on dummy samples for glass/glass modules

  • Stand-alone-alone tool for full module encapsulation mapping

  • In-line option for fixed test positions

  • No chemical procedures needed

  • Risk mitigation by quality feedback within minutes instead of seconds

  • Thin film deposition processes for perovskite top cells in tandem devices can be monitored in-situ and in-line regarding film thickness, bandgap, resistance and charge carrier lifetime

Name Size
Perovskite deposition kinetics application note 1.34 MB
Perovskite PVD application note 1.34 MB
X Link offline flyer 2.08 MB
X Link offline manual data sheet 1.69 MB
X Link flyer 219.31 KB
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Metrology solutions

The X Link® metrology system employs an exclusively licensed method developed by Fraunhofer USA relying on the principle of thermos-mechanical indentation. By this method, the degree of cross-linking – which is usually deduced from the so-called gel-content in destructive time-consuming chemical methods using Soxhlet extraction – is determined in a rapid non-destructive measurement. This allows for a much tighter process control and quality assurance during PV module encapsulation. Additionally, recurring costs for samples extraction, chemical lab infrastructure and disposal of chemical and in some cases toxic chemical waste can be completely avoided leading to typical payback times of some weeks up to only a few months.

For tandem devices the deposition of the respective thin film solar cell deposited on top of the c-Si solar cell can be monitored by LayTec’s thin film metrology methods described in the perovskite section.

 

Contact

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