Flames

In-line monitoring multi-layer thin-film structures in large area processes by means of spectral reflectance

LayTec's Flames is a multi-head optical metrology system for in-line monitoring of multi-layer thin-film structures in large area coating processes. It measures multiple traces of layer thickness, reflectance, and transmittance for assessing sample uniformity directly after the deposition in in-line configuration with thickness resolutions down to less than 1 nm.

Typical applications are functional layers in thin film photovoltaics, display industries, foil coating (roll-to-roll), and glass coating in general. Flames is suitable for nearly any thin-film production line. With its contact-free optical approach it measures close to the process and allows closed-loop control of layer deposition and etching. With LayTec Flames you get homogeneity information of the layers at the tact rate of your line, directly after processing, complete with statistical analysis. You can apply quality thresholds and alarms for fast reaction of operators

  • Reflectance and transmittance measurements for functional glasses and foils

  • Layer thickness measurements for functional glasses and foils

  • Integration into production lines for sheet-to-sheet (S2S) or roll-to-roll (R2R) manufacturing

  • Characterization of various layers such as:

    • antireflective or IR-reflective coatings

    • CIGS, perovskites, CdTe, CdSe, CdS or organic photovoltaic materials

    • Electrochromic glasses

    • Displays and OLEDs

    • Food packaging foils

    • Decorative foils

  • Reflectance, transmittance monitoring at up to seven traces

  • Layer thickness can be calculated based on sophisticated optical models

  • Customized optical mounts to meet the requirements of your automation system

  • PV-line software integration via Profibus, Ethernet, TCP/IP or other protocols for automated operation

  • Like PearL and t-PearL, Flames can be a component of ILMetro stations

Name Size
Flames data sheet 752.65 KB
Flames flyer 278.22 KB
Flames IR application note 2.12 MB
In-line monitoring of layer properties and thickness application note 526.33 KB
In-line thickness monitoring R2R OLED and OPV application note 1.09 MB
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Features

  • Fully automated in-line monitoring of thin film thickness during production

  • Up to seven traces along the substrate can be measured

  • Available for VIS, NIR and combined spectral range

  • Further information about transmission, color, roughness and band gap can be deduced

  • Eddy-current measurements can be added on demand

Contact

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