Interview: Oxford Instrument feat. LayTec

Our CTO and co-founder Kolja Haberland was recently interviewed by Ian Wright of OXFORD INSTRUMENTS PLASMA TECHNOLOGY LIMITED for their Semi Interface magazine!

In this candid exchange, Kolja shares insights from two decades of shaping in-situ metrology for compound semiconductors – covering everything from the evolution of GaN power electronics to the development of our Etchpoint system for plasma etch endpoint control.

🔍 What’s inside:
- How LayTec supported GaN and RF markets from lab-scale to HVM
- Why wafer bow, ternary composition, and in-situ monitoring still matter
- The role of Connected Metrology^® in improving yield and precision

Read the interview here

Or access the full magazine here:
https://plasma.oxinst.com/media-centre/semi-interface-autumn-2025