In-situ monitoring of perovskite formation

LayTec's InspiRe system delivers high-precision in-situ reflectometry for perovskite film monitoring.

Whether you're spin-coating, slot-die coating, or working with PVD (thermal evaporation), InspiRe tracks:
✅ Wet & dry thickness
✅ Band gap evolution
✅ Surface roughness
✅ Reaction kinetics

📊 Applying InspiRe in your lab will let you see how real-time fringe analysis reveals process dynamics during annealing and deposition.

More insight means faster process development and faster scale-up.